Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
Cross-correlation based analysis methods have been developed for electron back scatter diffraction (EBSD) patterns that improve the angular sensitivity to ∼10 -4 rads. This enables EBSD to be used to study the much smaller misorientations and even local elastic strain fields...
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| Format: | Journal article |
| Language: | English |
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2011
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