Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction

Cross-correlation based analysis methods have been developed for electron back scatter diffraction (EBSD) patterns that improve the angular sensitivity to ∼10 -4 rads. This enables EBSD to be used to study the much smaller misorientations and even local elastic strain fields...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awdur: Wilkinson, A
Fformat: Journal article
Iaith:English
Cyhoeddwyd: 2011