Motion of light adatoms and molecules on the surface of few-layer graphene.
Low-voltage aberration-corrected transmission electron microscopy (TEM) is applied to investigate the feasibility of continuous electron beam cleaning of graphene and monitor the removal of residual species as present on few-layer graphene (FLG) surfaces. This combined approach allows us to detect l...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2011
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