PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

Slični predmeti

• Diffraction behaviour of three-component Fibonacci Ta/Al multilayer films
  od: Jiang, S, i dr.
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• AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES
  od: Jiang, S, i dr.
  Izdano: (1992)
• X-Ray Diffraction Technique for Residual Stress Measurement in NiCrMo Alloy Weld Metal
  od: Vladimir Ivanovitch Monine, i dr.
  Izdano: (2018-01-01)
• Wave diffraction by periodic multilayer structures /
  od: Litvinenko, L. N. (Leonid Nikolaevich), i dr.
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• Investigation of structural and reflective characteristics of short-period Mo/B4C multilayer X-ray mirrors
  od: Roman Shaposhnikov, i dr.
  Izdano: (2024-03-01)