PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

Detalhes bibliográficos
Principais autores: Jiang, S, Zou, J, Cockayne, D, Hu, A, Sikorski, A
Formato: Journal article
Publicado em: 1995

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