ATPG for reversible circuits using technology−related fault models
We address the problem of test set generation and test set reduction, to first detect, and later localize faults occurring in reversible circuits. Reversible Computation has high promise of low power consumption. Some new fault models are first presented here. An explanation of the new fault models...
| Автори: | , |
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| Формат: | Journal article |
| Опубліковано: |
2005
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