The von Neumann Theil index: Characterizing graph centralization using the von Neumann index
We show that the von Neumann entropy (from herein referred to as the von Neumann index) of a graph’s trace normalized combinatorial Laplacian provides structural information about the level of centralization across a graph. This is done by considering the Theil index, which is an established statist...
| Main Authors: | , , |
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| פורמט: | Journal article |
| יצא לאור: |
Oxford University Press
2018
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