Exploiting diffusion currents at Ohmic contacts for trap characterization in organic semiconductors
Studying space-charge limited currents enables fundamental insight into the properties of charge carrier transport. However, in unipolar devices with Ohmic contacts, diffusion of charge carriers from the contacts into the intrinsic layer can dominate the current-voltage (J-V) characteristics, especi...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Elsevier
2014
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