APA (7th ed.) Citation

Fischer, J., Tress, W., Kleemann, H., Widmer, J., Leo, K., & Riede, M. (2014). Exploiting diffusion currents at Ohmic contacts for trap characterization in organic semiconductors. Elsevier.

Chicago Style (17th ed.) Citation

Fischer, J., W. Tress, H. Kleemann, J. Widmer, K. Leo, and M. Riede. Exploiting Diffusion Currents at Ohmic Contacts for Trap Characterization in Organic Semiconductors. Elsevier, 2014.

MLA (9th ed.) Citation

Fischer, J., et al. Exploiting Diffusion Currents at Ohmic Contacts for Trap Characterization in Organic Semiconductors. Elsevier, 2014.