Stable field effect surface passivation of n-type Cz silicon

Stable field effect surface passivation of n-type Cz silicon

Surface recombination of carriers in solar cells can cause a significant reduction in their efficiency and is most commonly minimized by the deposition of surface dielectric layers which simultaneously perform two functions; efficient passivation of surface recombination and the provision of an effe...

Cur síos iomlán

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Bonilla, R, Wilshaw, P
Formáid:	Conference item
Foilsithe / Cruthaithe:	2013

Míreanna comhchosúla

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