Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon

Ижил төстэй зүйлс

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  -н: Chou, C, зэрэг
  Хэвлэсэн: (1995)
• {111} and {311} rod-like defects in silicon ion implanted silicon
  -н: Chou, C, зэрэг
  Хэвлэсэн: (1996)
• Double-shot MeV electron diffraction and microscopy
  -н: P. Musumeci, зэрэг
  Хэвлэсэн: (2017-07-01)
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  Хэвлэсэн: (1986)
• New experimental results for the 17 MeV particle created in 8Be
  -н: Krasznahorkay A.J., зэрэг
  Хэвлэсэн: (2017-01-01)