Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon

Παρόμοια τεκμήρια

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  Έκδοση: (1995)
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• Double-shot MeV electron diffraction and microscopy
  ανά: P. Musumeci, κ.ά.
  Έκδοση: (2017-07-01)
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• New experimental results for the 17 MeV particle created in 8Be
  ανά: Krasznahorkay A.J., κ.ά.
  Έκδοση: (2017-01-01)