Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser
Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as f...
| Main Authors: | , , , , , , , , , , , , |
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| Format: | Conference item |
| Published: |
1999
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