Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser
Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as f...
| Main Authors: | , , , , , , , , , , , , |
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| Format: | Conference item |
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1999
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| _version_ | 1797088926704336896 |
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| author | Kalantar, D Chandler, E Colvin, J Lee, R Remington, B Weber, S Hauer, A Wark, J Loveridge, A Failor, B Meyers, M Ravichandran, G Wiley, L |
| author_facet | Kalantar, D Chandler, E Colvin, J Lee, R Remington, B Weber, S Hauer, A Wark, J Loveridge, A Failor, B Meyers, M Ravichandran, G Wiley, L |
| author_sort | Kalantar, D |
| collection | OXFORD |
| description | Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. (C) 1999 American Institute of Physics. [S0034-6748(99)62601-6]. |
| first_indexed | 2024-03-07T02:57:06Z |
| format | Conference item |
| id | oxford-uuid:afb269ec-1173-46cf-b2e7-d660bf803a7f |
| institution | University of Oxford |
| last_indexed | 2024-03-07T02:57:06Z |
| publishDate | 1999 |
| record_format | dspace |
| spelling | oxford-uuid:afb269ec-1173-46cf-b2e7-d660bf803a7f2022-03-27T03:51:08ZTransient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laserConference itemhttp://purl.org/coar/resource_type/c_5794uuid:afb269ec-1173-46cf-b2e7-d660bf803a7fSymplectic Elements at Oxford1999Kalantar, DChandler, EColvin, JLee, RRemington, BWeber, SHauer, AWark, JLoveridge, AFailor, BMeyers, MRavichandran, GWiley, LTransient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. (C) 1999 American Institute of Physics. [S0034-6748(99)62601-6]. |
| spellingShingle | Kalantar, D Chandler, E Colvin, J Lee, R Remington, B Weber, S Hauer, A Wark, J Loveridge, A Failor, B Meyers, M Ravichandran, G Wiley, L Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser |
| title | Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser |
| title_full | Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser |
| title_fullStr | Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser |
| title_full_unstemmed | Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser |
| title_short | Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser |
| title_sort | transient x ray diffraction used to diagnose shock compressed si crystals on the nova laser |
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