Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations
Weak-beam diffraction-contrast electron microscope images of stacking-fault tetrahedra (SFT) have been simulated by solving numerically the Howie-Basinski equations, which are well suited for studying the dependence of image contrast on experimental parameters. These simulated images are in good qua...
| প্রধান লেখক: | , , , , |
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| বিন্যাস: | Conference item |
| প্রকাশিত: |
2006
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