Jenkins, M., Zhou, Z., Dudarev, S., Sutton, A., & Kirk, M. (2006). Electron microscope weak-beam imaging of stacking fault tetrahedra: Observations and simulations.
芝加哥风格引文Jenkins, M., Z. Zhou, S. Dudarev, A. Sutton, 与 M. Kirk. Electron Microscope Weak-beam Imaging of Stacking Fault Tetrahedra: Observations and Simulations. 2006.
MLA引文Jenkins, M., et al. Electron Microscope Weak-beam Imaging of Stacking Fault Tetrahedra: Observations and Simulations. 2006.
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