Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations
Weak-beam diffraction-contrast electron microscope images of stacking-fault tetrahedra (SFT) have been simulated by solving numerically the Howie-Basinski equations, which are well suited for studying the dependence of image contrast on experimental parameters. These simulated images are in good qua...
| Những tác giả chính: | , , , , |
|---|---|
| Định dạng: | Conference item |
| Được phát hành: |
2006
|