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IMAGING OF SEMICONDUCTOR DEFEC...
Čujuhandieđut
Deakstadieđáhus
Sádde šleađgaboasttain
Čálit
Doalvvo čujuhusa
Doalvun: RefWorks
Doalvun: EndNoteWeb
Doalvun: EndNote
Bissovaš liŋka
IMAGING OF SEMICONDUCTOR DEFECTS USING ION CHANNELING
Bibliográfalaš dieđut
Váldodahkkit:
King, P
,
Breese, M
,
Wilshaw, P
,
Booker, G
,
Grime, C
,
Watt, F
,
Goringe, M
Materiálatiipa:
Conference item
Almmustuhtton:
1993
Oažžasuvvandieđut
Govvádus
Geahča maid
Bargiidšearbma
Geahča maid
CRYSTAL DEFECT IMAGING USING TRANSMISSION ION CHANNELING
Dahkki: King, P, et al.
Almmustuhtton: (1994)
IMAGING OF DEEP DEFECTS USING TRANSMISSION ION CHANNELING
Dahkki: King, P, et al.
Almmustuhtton: (1995)
DISLOCATION IMAGING WITH A SCANNING PROTON MICROPROBE USING CHANNELING SCANNING-TRANSMISSION ION MICROSCOPY (CSTIM)
Dahkki: King, P, et al.
Almmustuhtton: (1993)
TRANSMISSION ION CHANNELING IMAGES OF CRYSTAL DEFECTS
Dahkki: King, P, et al.
Almmustuhtton: (1995)
Defect imaging and channeling studies using channeling scanning transmission ion microscopy
Dahkki: King, P, et al.
Almmustuhtton: (1996)