Measurement of the electron-density profile in a discharge-ablated capillary waveguide.
We present the results of time-resolved interferometric measurements of the electron-density profile in a discharge-ablated capillary waveguide. We observe the development of a pronounced axial minimum in the electron-density profile with a relative depth of as much as 60% of the axial electron dens...
| Հիմնական հեղինակներ: | , , |
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| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
Optical Society of America Inc.
1999
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