Examining the stability of folded graphene edges against electron beam induced sputtering with atomic resolution
Low energy electron beam irradiation of the edges of graphene can lead to rearrangement of the carbon atomic structure. We demonstrate the ability to distinguish intrinsic edges of graphene from edges formed by back folding based upon atomic structure and their susceptibility to sputtering. We exami...
| Κύριοι συγγραφείς: | , , , |
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| Μορφή: | Journal article |
| Γλώσσα: | English |
| Έκδοση: |
2010
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