Scanning transmission electron microscopy investigations of self-forming diffusion barrier formation in Cu(Mn) alloys on SiO2
Scanning transmission electron microscopy in high angle annular dark field mode has been used to undertake a characterisation study with sub-nanometric spatial resolution of the barrier formation process for a Cu(Mn) alloy (90%/10%) deposited on SiO2. Electron energy loss spectroscopy (EELS) measure...
| मुख्य लेखकों: | , , , , , |
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| स्वरूप: | Journal article |
| भाषा: | English |
| प्रकाशित: |
American Institute of Physics Inc.
2013
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