Dyfyniad APA

Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING.

Dyfyniad Arddull Chicago

Czernuszka, J., N. Long, and P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.

Dyfyniad MLA

Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.