Παραπομπή σε μορφή APA (7η εκδ.)

Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Czernuszka, J., N. Long, και P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.

Παραπομπή σε μορφή MLA (9th εκδ.)

Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.