Lua APA (7ú heag.)

Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING.

Lua i Stíl Chicago (17ú heag.)

Czernuszka, J., N. Long, agus P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.

Lua MLA (9ú heag.)

Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.

Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.