Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING.
Citazione stile Chigago Style (17a edizione)Czernuszka, J., N. Long, e P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.
Citatione MLA (9a ed.)Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.
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