APA-ийн эшлэл(7 дахь хэвлэлт)

Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING.

Чикаго-гийн эшлэл (17 дахь хэвлэлт)

Czernuszka, J., N. Long, ба P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.

MLA -ийн эшлэл (9 дэх хэвлэлт)

Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.