Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING.
Chicago-čujuhus (17. p.)Czernuszka, J., N. Long, juo P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.
MLA-čujuhus (9. p.)Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. 1991.
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