ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

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Detalhes bibliográficos
Principais autores:	Czernuszka, J, Long, N, Hirsch, P
Formato:	Journal article
Publicado em:	1991

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