ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Czernuszka, J, Long, N, Hirsch, P
Μορφή:	Journal article
Έκδοση:	1991

Παρόμοια τεκμήρια

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
ανά: Czernuszka, J, κ.ά.
Έκδοση: (1991)

ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
ανά: Wilkinson, A, κ.ά.
Έκδοση: (1993)

ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
ανά: Czernuszka, J, κ.ά.
Έκδοση: (1991)

ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
ανά: Wilkinson, A, κ.ά.
Έκδοση: (1993)

Effects of surface relaxation on electron channelling contrast images of misfit dislocations
ανά: Wilkinson, A, κ.ά.
Έκδοση: (1994)

IMAGING OF SEMICONDUCTOR DEFECTS USING ION CHANNELING
ανά: King, P, κ.ά.
Έκδοση: (1993)

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces
ανά: Dudarev, S, κ.ά.
Έκδοση: (1995)

EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1991)

IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
ανά: Czernuszka, J, κ.ά.
Έκδοση: (1990)

THE EFFECTS OF SURFACE STRESS-RELAXATION ON ELECTRON CHANNELING CONTRAST IMAGES OF DISLOCATIONS
ανά: Wilkinson, A, κ.ά.
Έκδοση: (1995)

Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
ανά: Ahmed, J, κ.ά.
Έκδοση: (1997)

Survey of semiconductor physics : electrons and other particles in bulk semiconductors /
ανά: 342198 Boer, Karl W.
Έκδοση: (1990)

Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu
ανά: Ahmed, J, κ.ά.
Έκδοση: (1998)

Defect electronics in semiconductors
ανά: 269076 Matare, Herbert Franz
Έκδοση: (1971)

The methodology of modeling of electronic properties of bulk semiconductor compounds
ανά: A. V. Krivosheeva, κ.ά.
Έκδοση: (2019-06-01)

OpenECCI - A Streamlined Open-Source Workflow for Electron Channelling Contrast Imaging of Crystal Defects
ανά: Xu Zhou, κ.ά.
Έκδοση: (2024-01-01)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2008)

Theory of defects in solids : electronic structure of defects in insulators and semiconductors
ανά: 375532 Stoneham, A. M.
Έκδοση: (1975)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
ανά: Czernuszka, J
Έκδοση: (1989)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
ανά: Czernuszka, J
Έκδοση: (1989)

Examination of dislocation substructures in fatigued Cu using electron channelling contrast imaging
ανά: Ahmed, J, κ.ά.
Έκδοση: (1999)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2006)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2006)

Hydrogen in semiconductors : bulk and surface properties/
ανά: Trieste IUPAP-ICTP Semiconductor Symposium (6th : 1990 : Trieste, Italy), κ.ά.
Έκδοση: (1991)

Defects in semiconductors/
ανά: Narayan, J., κ.ά.
Έκδοση: (1980)

Electron diffraction based techniques in scanning electron microscopy of bulk materials
ανά: Wilkinson, A, κ.ά.
Έκδοση: (1998)

Electron diffraction based techniques in scanning electron microscopy of bulk materials
ανά: Wilkinson, A, κ.ά.
Έκδοση: (1997)

Weakly Supervised Image Segmentation for Detecting Defects From Scanning Electron Microscopy Images in Semiconductor
ανά: Younghwan Lee, κ.ά.
Έκδοση: (2024-01-01)

Depth Dependence of Electron Channeling Contrast Imaging in Gallium Nitride
ανά: Lavallee Etienne, κ.ά.
Έκδοση: (2024-01-01)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2007)

Compound semiconductor bulk materials and characterizations /
ανά: 173111 Oda, Osamu
Έκδοση: (2007)

Quantitative simulations of electron channelling patterns and electron backscattering from crystals
ανά: Dudarev, S, κ.ά.
Έκδοση: (1994)

Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
ανά: Ahmed, J, κ.ά.
Έκδοση: (2006)

Electron Channeling Contrast Imaging (ECCI) of Ion Battery Cathode Materials
ανά: Naghizadeh Meysam, κ.ά.
Έκδοση: (2024-01-01)

A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images
ανά: Francisco López de la Rosa, κ.ά.
Έκδοση: (2021-10-01)

Automatic Semiconductor Wafer Image Segmentation for Defect Detection Using Multilevel Thresholding
ανά: Saad N.H., κ.ά.
Έκδοση: (2016-01-01)

SEM imaging of contrast arising from different doping concentrations in semiconductors
ανά: Sealy, C, κ.ά.
Έκδοση: (1995)

Weyl points and exceptional rings with polaritons in bulk semiconductors
ανά: R. L. Mc Guinness, κ.ά.
Έκδοση: (2020-11-01)

Bulk versus Contact Doping in Organic Semiconductors
ανά: Chang-Hyun Kim
Έκδοση: (2021-06-01)

Stabilization of semiconductor surfaces through bulk dopants
ανά: Nikolaj Moll, κ.ά.
Έκδοση: (2013-01-01)