ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

Ижил төстэй зүйлс

• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  -н: Czernuszka, J, зэрэг
  Хэвлэсэн: (1991)
• ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
  -н: Wilkinson, A, зэрэг
  Хэвлэсэн: (1993)
• ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
  -н: Czernuszka, J, зэрэг
  Хэвлэсэн: (1991)
• ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
  -н: Wilkinson, A, зэрэг
  Хэвлэсэн: (1993)
• Effects of surface relaxation on electron channelling contrast images of misfit dislocations
  -н: Wilkinson, A, зэрэг
  Хэвлэсэн: (1994)