ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

समान संसाधन

• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  द्वारा: Czernuszka, J, और अन्य
  प्रकाशित: (1991)
• ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
  द्वारा: Wilkinson, A, और अन्य
  प्रकाशित: (1993)
• ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
  द्वारा: Czernuszka, J, और अन्य
  प्रकाशित: (1991)
• ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
  द्वारा: Wilkinson, A, और अन्य
  प्रकाशित: (1993)
• Effects of surface relaxation on electron channelling contrast images of misfit dislocations
  द्वारा: Wilkinson, A, और अन्य
  प्रकाशित: (1994)