Mapping two-dimensional state of strain using synchrotron x-ray diffraction

Mapping two-dimensional state of strain using synchrotron x-ray diffraction

Bibliographic Details
Main Authors: Korsunsky, A, Wells, K, Withers, P
Other Authors: Acta Materialia
Format: Journal article
Language:English
Published: Elsevier 1998
Subjects:
Engineering & allied sciences

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