Improvement of multilayer analyses with a three-dimensional atom probe

Owing to their giant magnetoresistance properties, multilayer thin-film materials are widely used in information storage technology. However, because this magnetic behaviour is highly sensitive to interface roughness and diffusivity on a subnanometre scale, the structural characterization of these m...

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Detalles Bibliográficos
Autores principales: Vurpillot, F, Larson, D, Cerezo, A
Formato: Conference item
Publicado: 2004