Improvement of multilayer analyses with a three-dimensional atom probe

Owing to their giant magnetoresistance properties, multilayer thin-film materials are widely used in information storage technology. However, because this magnetic behaviour is highly sensitive to interface roughness and diffusivity on a subnanometre scale, the structural characterization of these m...

সম্পূর্ণ বিবরণ

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Vurpillot, F, Larson, D, Cerezo, A
বিন্যাস: Conference item
প্রকাশিত: 2004