Improvement of multilayer analyses with a three-dimensional atom probe
Owing to their giant magnetoresistance properties, multilayer thin-film materials are widely used in information storage technology. However, because this magnetic behaviour is highly sensitive to interface roughness and diffusivity on a subnanometre scale, the structural characterization of these m...
| Main Authors: | , , |
|---|---|
| 格式: | Conference item |
| 出版: |
2004
|