Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)
Three-dimensional atom probe analyses of the interfaces between CoFe and Cu layers has shown that both roughness and chemical intermixing can occur independently. Interfaces formed by the deposition of Cu onto CoFe mimic the roughness present in previously deposited interfaces, but have a very small...
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| Materiálatiipa: | Conference item |
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2001
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