Precision metrology with weak measurements
We develop a framework for the precision metrology with weak measurements, and use it to compare the precisions of different measurement strengths. In particular, we show a weak-measurement scheme that can achieve the Heisenberg limit. © OSA 2014.
| Main Authors: | , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
Optical Society of America
2014
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