Precision metrology with weak measurements

We develop a framework for the precision metrology with weak measurements, and use it to compare the precisions of different measurement strengths. In particular, we show a weak-measurement scheme that can achieve the Heisenberg limit. © OSA 2014.

Detalles Bibliográficos
Main Authors: Zhang, L, Datta, A, Walmsley, I
Formato: Journal article
Idioma:English
Publicado: Optical Society of America 2014