Band-gap shrinkage in n-type-doped CdO probed by photoemission spectroscopy
The influence of n-type doping CdO with In or Y has been investigated by high-resolution ultraviolet and x-ray photoemission spectroscopy. It is found that core levels and valence band features suffer a shift to high binding energy due to doping. However this shift is less than the change in the wid...
| 主要な著者: | , , , , |
|---|---|
| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
American Physical Society
1997
|
| 主題: |
| 要約: | The influence of n-type doping CdO with In or Y has been investigated by high-resolution ultraviolet and x-ray photoemission spectroscopy. It is found that core levels and valence band features suffer a shift to high binding energy due to doping. However this shift is less than the change in the width of the occupied conduction band. This provides a direct measurement of band gap shrinkage as a result of doping in an oxide semiconductor. |
|---|