Modelling the upper yield point and the brittle-ductile transition of silicon wafers in three-point bend tests
Three-point bend tests carried out by Folk [R.H. Folk, The brittle to ductile transition in silicon: evidence of a criticaly yield event. PhD thesis, University of Pennsylvania (2000).] on initially dislocation-free specimens of semiconductor-grade single crystals of Si showed that, for a given stra...
| Главные авторы: | , |
|---|---|
| Формат: | Journal article |
| Язык: | English |
| Опубликовано: |
2006
|