$Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells$

Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells

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The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, f...

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Библиографические подробности
Главные авторы:	Abou-Ras, D, Kavalakkatt, J, Nichterwitz, M, Schäfer, N, Harndt, S, Wilkinson, A, Tsyrulin, K, Schulz, H, Bauer, F
Формат:	Journal article
Язык:	English
Опубликовано:	2013

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