Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells

Eitemau Tebyg

• Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells
  gan: Abou-Ras, D, et al.
  Cyhoeddwyd: (2013)
• Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
  gan: Schäfer, N, et al.
  Cyhoeddwyd: (2016)
• Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
  gan: Trager-Cowan, C, et al.
  Cyhoeddwyd: (2006)
• Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
  gan: Trager-Cowan, C, et al.
  Cyhoeddwyd: (2006)
• Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
  gan: Trager-Cowan, C, et al.
  Cyhoeddwyd: (2007)