Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films
We have studied the effect of the Cu capping thickness (in the range 20 ≤ tcu ≤ 180 Å) on the magnetic and structural properties of ultrathin FCC 40Å Ni/Cu(001) films by means of magneto-optic Kerr effect (MOKE) magnetometry, polarised neutron reflection (PNR) and grazing incidence X-ray surface dif...
Main Authors: | Vaz, C, Lauhoff, G, Bland, J, Fulthorpe, B, Hase, T, Tanner, B, Langridge, S, Penfold, J |
---|---|
Format: | Conference item |
Published: |
2001
|
Similar Items
-
Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(001) epitaxial structures
by: Vaz, C, et al.
Published: (2007) -
Magnetic anisotropy and layer-selective magnetometry of Cu/Co/Ni/Cu/Si (001)
by: Lauhoff, G, et al.
Published: (1999) -
Magnetic anisotropy, magnetic moments and coupling of Cu/Co/Cu/Ni/Cu(001) trilayer
by: Lauhoff, G, et al.
Published: (1999) -
Origin of the Co uniaxial volume anisotropy of the fcc Co/Ni/Cu(001) system
by: Lauhoff, G, et al.
Published: (1999) -
Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system
by: Hope, S, et al.
Published: (1997)