Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films

Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films

We have studied the effect of the Cu capping thickness (in the range 20 ≤ tcu ≤ 180 Å) on the magnetic and structural properties of ultrathin FCC 40Å Ni/Cu(001) films by means of magneto-optic Kerr effect (MOKE) magnetometry, polarised neutron reflection (PNR) and grazing incidence X-ray surface dif...

書誌詳細
主要な著者:	Vaz, C, Lauhoff, G, Bland, J, Fulthorpe, B, Hase, T, Tanner, B, Langridge, S, Penfold, J
フォーマット:	Conference item
出版事項:	2001

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