Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature
Príomhchruthaitheoirí: | Glasko, J, Elliman, R, Zou, J, Cockayne, D, Gerald, F |
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Formáid: | Journal article |
Foilsithe / Cruthaithe: |
1998
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Míreanna comhchosúla
Míreanna comhchosúla
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