Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature

Detaylı Bibliyografya
Asıl Yazarlar: Glasko, J, Elliman, R, Zou, J, Cockayne, D, Gerald, F
Materyal Türü: Journal article
Baskı/Yayın Bilgisi: 1998