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Strain and defect microstructu...
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Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature
书目详细资料
Main Authors:
Glasko, J
,
Elliman, R
,
Zou, J
,
Cockayne, D
,
Gerald, F
格式:
Journal article
出版:
1998
持有资料
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