GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS

Бусад хувилбаруудыг харуулах (1)

Selected results from a TEM study of copper precipitation at extended surface defects in silicon are reported. The relative getting effectiveness of surface pits, oxidation induced stacking faults, and their bounding partials is compared. Copper-silicide precipitate colonies on {111} planes are obse...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	Decoteau, M, Wilshaw, P, Falster, R
Формат:	Journal article
Хэл сонгох:	English
Хэвлэсэн:	Publ by Inst of Physics Publ Ltd 1991

Ижил төстэй зүйлс

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS
-н: Decoteau, M, зэрэг
Хэвлэсэн: (1991)

GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
-н: Decoteau, M, зэрэг
Хэвлэсэн: (1992)

PRECIPITATION OF IRON IN SILICON - GETTERING TO EXTENDED SURFACE DEFECT SITES
-н: Decoteau, M, зэрэг
Хэвлэсэн: (1991)

GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
-н: Decoteau, M, зэрэг
Хэвлэсэн: (1990)

GETTERING IN SILICON
-н: Falster, R
Хэвлэсэн: (1989)

Cathodoluminescence assessment of low temperature gettering in silicon and a novel technique for estimating bulk minority carrier lifetime in silicon
-н: Fraser, K, зэрэг
Хэвлэсэн: (2008)

Efficient, room-temperature, near-band gap luminescence by gettering in ion implanted silicon
-н: Stowe, D, зэрэг
Хэвлэсэн: (2005)

Getters in silicon
-н: Vyacheslav A. Kharchenko
Хэвлэсэн: (2019-03-01)

Oxygen precipitate studies in silicon for gettering in solar cell applications
-н: Salomon, Ashley
Хэвлэсэн: (2018)

ELECTRON-BEAM-INDUCED ACTIVITY OF DEFECTS IN SILICON
-н: Wilshaw, P, зэрэг
Хэвлэсэн: (1994)

Gettering defects in semiconductors /
-н: 386064 Perevostchikov V. A., зэрэг
Хэвлэсэн: (2005)

Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon
-н: Tweddle, D, зэрэг
Хэвлэсэн: (2018)

Onset of slip in silicon containing oxide precipitates
-н: Jurkschat, K, зэрэг
Хэвлэсэн: (2001)

High-Performance and Traditional Multicrystalline Silicon: Comparing Gettering Responses and Lifetime-Limiting Defects
-н: Ekstrom, Kai E., зэрэг
Хэвлэсэн: (2018)

Exceptional gettering response of epitaxially grown kerfless silicon
-н: Markevich, V. P., зэрэг
Хэвлэсэн: (2018)

EBIC INVESTIGATIONS OF DISLOCATIONS AND THEIR INTERACTIONS WITH IMPURITIES IN SILICON
-н: Fell, T, зэрэг
Хэвлэсэн: (1993)

Detecting and gettering chromium impurities in photovoltaic crystalline silicon
-н: Jensen, Mallory Ann
Хэвлэсэн: (2015)

Saw damage gettering for industrially relevant mc‐Si feedstock
-н: Shaw, E, зэрэг
Хэвлэсэн: (2017)

Simulation of iron impurity gettering in crystalline silicon solar cells
-н: Powell, Douglas M. (Douglas Michael)
Хэвлэсэн: (2012)

Porous silicon and aluminum co-gettering experiment in p-type multicrystalline silicon substrate
-н: P.N. Vinod
Хэвлэсэн: (2007-01-01)

Improvement of charge carrier lifetime in heat exchange method multicrystalline silicon wafers by extended phosphorous gettering process
-н: D. Bouhafs, зэрэг
Хэвлэсэн: (2011-12-01)

Methods and mechanisms of gettering of silicon structures in the production of integrated circuits
-н: Pilipenko V. A., зэрэг
Хэвлэсэн: (2013-05-01)

Electron beam induced current investigations of transition metal impurities at extended defects in silicon
-н: Wilshaw, P, зэрэг
Хэвлэсэн: (1995)

Effects of Phosphorus Diffusion on Gettering of Metal Impurities in UMG Silicon Wafers
-н: Sung Yean Yoon, зэрэг
Хэвлэсэн: (2013-01-01)

The Physical mechanisms of gettering properties of nickel clusters in silicon solar cells
-н: Zoir Kenzhaev, зэрэг
Хэвлэсэн: (2024-06-01)

DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon
-н: Thienprasit, Jeanne A. (Jeanne Athya)
Хэвлэсэн: (2005)

Cathodoluminescence assessment of annealed silicon and a novel technique for estimating minority carrier lifetime in silicon
-н: Fraser, K, зэрэг
Хэвлэсэн: (2009)

Regularities of microdefect formation in silicon during heat treatment for internal getter synthesis
-н: Vladimir T. Bublik, зэрэг
Хэвлэсэн: (2019-09-01)

Transition metal gettering studies and simulation for the optimization of silicon photovoltaic device processing
-н: Smith, Aimée Louise, 1971-
Хэвлэсэн: (2005)

Evaluation of Hydrogen Gettering Rates Correlated to Surface Composition and Texture of Nickel-Plated Zircaloy Getters of Different Heat Treatment Procedures
-н: Ewa C. E. Rönnebro, зэрэг
Хэвлэсэн: (2023-01-01)

Effective lifetimes exceeding 300 μs in gettered p-type epitaxial kerfless silicon for photovoltaics
-н: Powell, D. M., зэрэг
Хэвлэсэн: (2015)

The segregation behaviour of oxygen at dislocations in silicon
-н: Senkader, S, зэрэг
Хэвлэсэн: (1999)

Locking of dislocations by oxygen in Cz-silicon
-н: Senkader, S, зэрэг
Хэвлэсэн: (1999)

Finite- vs. infinite-source emitters in silicon photovoltaics: Effect on transition metal gettering
-н: Vahanissi, Ville, зэрэг
Хэвлэсэн: (2018)

High resolution deep level transient spectroscopy applied to extended defects in silicon
-н: Evans-Freeman, J, зэрэг
Хэвлэсэн: (2005)

Recombination at oxide precipitates in silicon
-н: Murphy, J, зэрэг
Хэвлэсэн: (2011)

Generation of dislocation glide loops in Czochralski silicon
-н: Giannattasio, A, зэрэг
Хэвлэсэн: (2002)

Dislocation locking by nitrogen impurities in FZ-silicon
-н: Giannattasio, A, зэрэг
Хэвлэсэн: (2003)

On the mechanism of recombination at oxide precipitates in silicon
-н: Murphy, J, зэрэг
Хэвлэсэн: (2013)

Oxygen-dislocation interactions in silicon at temperatures below 700 degrees C: Dislocation locking and oxygen diffusion
-н: Senkader, S, зэрэг
Хэвлэсэн: (2001)