Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
Two approaches to the measurement of elastic strains from electron channelling patterns (ECPs) and electron backscatter diffraction (EBSD) patterns are assessed. Analysis of the shift in channelling (or Kikuchi) line positions has been shown to yield strain sensitivities of up to 3 parts in 10(4) wh...
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| Format: | Conference item |
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1997
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