Ptychographic imaging for the characterization of X-ray free-electron laser beams
We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations...
| Main Authors: | , , , , , , |
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| Format: | Conference item |
| Published: |
IOP Publishing
2017
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