Low-loss EELS of 2D boron nitride
Electron energy loss spectroscopy provides a probe of the dielectric function of a material which can be affected by the size and morphology of a sample. In this paper, the effect on the loss function when hexagonal boron nitride is reduced to a single layer is investigated. The previously predicted...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2012
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