Data for "Lowest surface recombination in n-type oxidised crystalline silicon by means of extrinsic field effect passivation"
Surface recombination remains a major factor limiting the efficiency of silicon solar cells. The post-processing of dielectric films used as surface coatings has been previously demonstrated an effective technique to improve their passivation quality. In this paper extrinsic methods are demonstrated...
| Những tác giả chính: | , , |
|---|---|
| Định dạng: | Dataset |
| Được phát hành: |
University of Oxford
2016
|